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    • High degree of testability using full scan chain and ATPG-An industrial perspective 

      Mamun, Ibne Reaz; Lee, W. F.; Hamid, N. H.; Lo, H. H.; Ali Yeon, Mohd Shakaff, Prof. Dr. (Asian Network for Scientific Information, 2009)
      This study describes an efficient design methodology from an industrial perspective on utilizing Register Transfer Level (RTL) coding style, full scan chain implementation and Automatic Test Pattern Generation (ATPG) to ...