Browsing Journal of Engineering Research and Education (JERE) by Subject "Integrated circuits -- Inspection"

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    • Artificial intelligence techniques in IC chip marking 

      Muthukaruppan, Kartigayan; Nagarajan, R.; Sazali, Yaacob; Pandian, Paulraj; Mohamed Rizon, Mohamed Juhari (Kolej Universiti Kejuruteraan Utara Malaysia, 2005)
      In this paper, an industrial machine vision system incorporating Optical Character Recognition (OCR) is employed to inspect the marking on the Integrated Circuit (IC) Chips. This inspection is carried out while the ICs are ...