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Items for Author "Kuan, Yew Cheong"

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Issue Date	Title	Author(s)
9-Jun-2010	Macro and nanoscopic characteristics of SiC-SiO2 interface roughness and leakage current through vacuum annealed thermally nitrided SiO2 gate on 4H-SiC	Kuan, Yew Cheong; Wei, Chong Goh; cheong@eng.usm.my