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Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/7362

Title: Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties
Authors: Zulkifli, Husin
Abdul Hallis, Abdul Aziz
R. Badlishah, Ahmad
???metadata.dc.contributor.url???: zulhusin@unimap.edu.my
Keywords: Capacitive and maturity;Dielectric;Agricultural products;Capacitance measurement;Nondestructive testing;Voltage measurement;Fruit maturity
Issue Date: 1-Dec-2008
Publisher: Institute of Electrical and Electronics Engineering (IEEE)
Citation: p.1-4
Series/Report no.: International Conference on Electronic Design (ICED 2008)
Abstract: Fruit maturity classification is hard to determine. This is certainly true, for some fruits whose color have no direct correlation with its level of maturity or ripeness. The levels of maturity can be determined by human expert, however for larger quantity inspection, this method is beyond practical. Therefore, accurate automatic classification for fruit maturity may be advantageous for the agriculture industry. In addition, consumers in supermarkets may also benefit from this system. This paper describes variant methods used for this purpose and the method which is proposed to enhance the measuring techniques. Feasibility study been conducted for nondestructive fruit maturity classifier system based on capacitive properties measurement methods using parallel-plate capacitor. This method is used to determine different levels of fruit maturity using dielectrics of banana hence it is suitable for this measuring technique because it does not destroy the texture and the nutrient of fruit.
Description: Link to publisher's homepage at http://ieeexplore.ieee.org
URI: http://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4786768
http://hdl.handle.net/123456789/7362
ISBN: 978-1-4244-2315-6
Appears in Collections:Conference Papers
R. Badlishah Ahmad, Prof. Dr.

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