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|Title: ||The phenomenological theory of Far-Infrared spectroscopy for a ferroelectric fim system|
|Authors: ||Mohamad Nazri, Abdul Halif|
Tilley, David R.
|Keywords: ||Ferroelectrics thin film;Ferroelectrics;Reflectivity;Phase Transition;Thin films;Ferroelectricity|
|Issue Date: ||5-Oct-2004|
|Publisher: ||Malaysian Institute of Physics & National University of Malaysia|
|Series/Report no.: ||The National Physics Conference (PERFIK 2004)|
|Abstract: ||We describe a detailed phenomenological theory of far-infrared (FIR) spectroscopy in symmetric and asymmetric ferroelectric (FE) film for the second and first-order phase transition. For the asymmetric FE film, a silicon (Si) substrate with a partial mirror at the top of the film is considered. The formalism is based on the Landau- Devonshire (L-D) model involving free-energy expansion in term of polarization for both order of phase transition and the optics calculation is described by Landau-Khalatnikov (L-K) equation of motion and electromagnetic wave equation. The calculation focuses only on the analytical solution with no surface effect δ −1 = 0 . Results of this work hopes to benefit development of future electronic devices.|
|Description: ||Organized by Malaysian Institute of Physics & National University of Malaysia, 5th - 7th October 2004 at Palace of the Golden Horses, Seri Kembangan, Selangor.|
|Appears in Collections:||Conference Papers|
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