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http://hdl.handle.net/123456789/10165
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| Title: | Development of a simultaneously elementary analysis for clay minerals using EDXRF |
| Authors: | Meor Yusoff, M. S.
Masliana, M.
Wilfred, P.
Parimala, Devi |
| Keywords: | EDXRF
Clay minerals
Al
Si
K
Ca
Ti
Fe
International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI) |
| Issue Date: | 9-Jun-2010 |
| Publisher: | Universiti Malaysia Perlis |
| Department: | School of Materials Engineering & School of Environmental Engineering |
| Citation: | p.280-289 |
| Series/Report no.: | Proceedings of the International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI) 2010 |
| Abstract: | The paper relates a study in developing a
quantitative elemental analysis for clay
minerals by the EDXRF technique.
Elements of interest are Al, Si, K, Ca, Ti
and Fe. The Regression method involved
development of calibration graphs of
each of these elements using six
different clay minerals reference
standards. Straight lines were obtained
from these calibration graphs with R2
values ranging from 0.923 to 0.997. The
accuracy of this Regression method was
then tested by comparing the
quantitative analysis result obtained
from Fundamental Parameter method
using argillaceous limestone reference
standard as the sample. Fundamental
Parameter method gives a more accurate
result than that of the Regression
method. |
| Description: | International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia. |
| URI: | http://hdl.handle.net/123456789/10165 |
| ISBN: | 978-967-5760-02-0 |
| Appears in Collections: | Conference Papers
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