Now showing items 1-1 of 1

    • Specific contact resistance of ohmic contacts to n-type SiC membranes 

      Nashrul Fazli, Mohd Nasir, Dr.; Holland, Anthony Stephen; Reeves, Geoffrey K.; Leech, Patrick William; Collins, Andrew M.; Tanner, Philip G. (Materials Research Society, 2011-04)
      Membranes of epitaxial SiC have been used as a means of eliminating the leakage current into the Si substrate during circular transmission line model (CTLM) measurements. In the n +- 3C-SiC/ Si wafers, the Si substrate was ...