Browsing by Author "Thulasiram, Karthikram B."

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    • Four point probe geometry modified correction factor for determining resistivity 

      Algahtani, Fahid; Thulasiram, Karthikram B.; Nashrul Fazli, Mohd Nasir, Dr.; Holland, Anthony Stephen (The International Society for Optical Engineering (SPIE), 2013-12-09)
      The four-point probe technique is well known for its use in determining sheet resistance and resistivity (or effective resistivity) of thin films. Using a standard four-point probe setup, relatively large area samples are ...